Timing, memory, power dissipation, testing, and testability are all crucial elements of VLSI circuit design. In this volume culled from the popular VLSI Handbook, experts from around the world provide in-depth discussions on these and related topics. Stacked gate, embedded, and flash memory all receive detailed treatment, including their power cons
Memory, Microprocessor, and ASIC
Wai-Kai Chen
CRC Press
2003
384 páginas
12h 48m
ISBN-13: 9781135499259
Inglês
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